06/03/2014

Avantes B.V.

Thin Film measurements

For single layer thin film measurements, this system provides the needed tools. It includes a reflection probe and a stage. It can measure thin films ranging from 10 nm to 50 μm with a resolution of 1 nm. It supports UV/VIS and NIR measurements from 200 - 1100 nm. For more info see http://avantes.com/products/systems-bundles/item/895-thin-film