Fraunhofer Centre for Silicon Photovoltaics (CSP) has officially confirmed that Sharp Solar photovoltaic (PV) modules are potential-induced degradation (PID) resistant. The Sharp module tested was the ND-R250A5, a high-performance PV module made of polycrystalline silicon solar cells with module efficiencies of 15.2%.
One module each from 13 renowned solar module manufacturers was independently tested for PID by Fraunhofer CSP at 50°C (122°F) with a relative humidity of 50%. The other 12 companies that had modules tested are (in alphabetic order): Canadian Solar Inc., Kyocera Solar, LG Electronics, Luxor Solar GmbH, Q-Cells SE, REC Solar, Schott Solar AG, S-Energy, Solarwatt AG, Suntech Power, Trina Solar and Yingli Green Energy Holding Co., Ltd.
PID can occur in the event of negative potential to earth and is accelerated by high system voltages, temperatures and humidity. Only four of the 13 modules tested passed the test and exhibited no signs of degradation. The remaining modules from other manufacturers showed in some cases serious collapses in power outputs of up to 98% compared with their initial power outputs.
"This is a very pleasing result for us, which clearly shows that there are major differences between the module manufacturers. At the same time it confirms the reliability of our own PID quality tests that are conducted in accordance with the stringent National Renewable Energy Laboratory (NREL) standards. NREL standards are in excess of 96 hours at 60°C (140°F), 85% humidity and 1000 volts (V) on each new product," declares Peter Thiele, executive vice president of Sharp Energy Solution Europe.
Source: Sharp Solar/solarnovus.com