The German SURAGUS GmbH develops non-destructive testing systems for both inline and offline characterization of functional thin-films. The systems are based on eddy current technology and allow testing of sheet resistance and layer thickness measurement of wafer-based systems, metallic thin-films (Al, Mo, Zn, Ag), and functional transparent thin-films on glass and foils (ITO, Graphene, CNT, metal grids)
SURAGUS offers single-point devices as well as inline systems and mapping solutions for the quality assurance of thin film systems on glass and foil. The innovative measuring systems are contactless and fast. The measuring results are displayed through an easy-to-handle software.
A visit of our booth 15 / C07 will convince you of our EddyCus TF series.