For over 20 years, STIL has been creating high-performance optical instrumentation. Inventor of chromatic confocal imaging, a leading technology for non-contact sensors, STIL has designed two families of sensors based on this innovative technology: Point sensors (from 0,1 mm up to 100mm measuring range) and Line sensor (from 1,35 mm up to 4 mm line length with different measuring ranges).
These high-resolution non-contact sensors meet the requirements of the most demanding applications for dimension, thickness or even roughness measurement, both in industry quality control and in research laboratories as high-precision instruments. They can measure any type of sample (transparent or opaque, polished or rough) and any type of material (metal, glass, ceramic, semiconductor, plastic...) and do not require any sample preparation.
STIL innovates through vision technology for fast inspection with "Depth of field" of "PERFECT FOCUS" and develops "à la carte" products for customers worldwide.